IRWeb INFO

Contents [FREE] - pp.127-128
Thermographic analysis of phacoemulsification based cataract surgery procedures
B.INNOCENTI, A.CORVI, R.MENCUCCI pp.129-140

Scale reduction in modeling landmine detection by IR thermography
A.MUSCIO, L.TAROZZI, M.CORTICELLI - pp.141-154

Improved ultrasound activated thermography using frequency analysis
A.GLEITER, C.SPIESSBERGER, G.BUSSE- pp.155-164

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{Image Courtesy Williamson Corporation}
From the Williamson IR website page on Applications of Dual Wavelength infrared thermometers:

“One of the greatest advantages of a dual-wavelength infrared thermometer is that the target can be smaller than the optical resolution of the sensor. This feature is particularly appropriate when viewing past an optical obstruction or when viewing a small or wandering target such as a thin wire…”

“For this application, the dual wavelength sensors are able to provide a relatively large target area of 0.5in diameter while measuring the significantly smaller wire. Using a dual-wavelength sensor it is possible to measure a wire that is less than 0.001in diameter and with a wander from side to side of as much as 0.2in.”

(ED NOTE: This IR thermometer type, dual wavelength or dual waveband wherein the dual signals are ratioed are sensitive to the ratio of the spectral emissivities in the two spectral wavelength bands and are only insensitive to emissivity changes if the emissivity ratio does not change.

In such a situation the object of measurement is called a gray body, and it is relatively rare except for some of the Iron Oxides that are found on Iron & Steel within the wavelength regions used by many commercial relatively “short wavelength”, infrared thermometers, eg: 0.7 to 2.5 micrometers.)

Concord,MA, USA — As seen on the Williamson IR website:

“Single wavelength infrared thermometers filtered in the short wavelength region of 2.0 to 2.5 microns offer good performance when measuring low emissivity materials at low temperatures.”

“The accuracy improvement associated with the shorter wavelength sensor is shown in the figure below. The shorter wavelength sensor shows an improvement in measurement from about 18°F (10°C) to about 5°F (2.8°C) when measuring a 220°F (104°C) target with a 10% variation in emissivity. This alone does not explain the total improvement in accuracy achieved by the component supplier. The short wavelength measurement also benefits from the fact that most metals have a higher emissivity value at the shorter wavelength. Therefore, considering these two benefits the shorter wavelength sensor offers as much as ten times more accurate readings than is a long wavelength sensor.”

{Image: Courtesy Williamson Corporation}

Read the rest of an actual case story at www.williamsonir.com/page.php/id/233

ED NOTE: The terms “Short Wavelength” , “low emissivity” and “low temperature” are relative, of course and here they are used in the context of a measurement in the 150 to 1000°F temperature region of unoxidized metal surfaces.

True wafer temperature measurements in Molecular Beam Epitaxy, or MBE, is an applications story (Application Note 18) from LayTec GmbH in Germany about the benefits of this technology in semiconductor processing, especially for GaAs (Gallium Arsenide) and InP (Indium Phosphide), two materials that are opaque at the wavelength region of interest in the Near Infrared (NIR), 950 nm.

The lead in to the applications note reads as follows:

“LayTec’s in-situ sensors are state-of-the-art in-situ growth monitors for basic growth studies, process development, process transfer and for enhancing run-to-run reproducibility in production environment. These sensors are offered for a variety of growth systems in MBE, MOVCD and other growth techniques. All sensors are available with LayTec ?s True Temperature measurement mode based on emissivity corrected pyrometry: EpiTT, EpiR TT and EpiRAS TT“.

You can download a copy of the entire note: “True wafer temperature measurements in MBE “- CLICK HERE - PDF - 122 Kb

The 9th Quantitative InfraRed Thermography conference, QIRT2008, July 2–5, 2008 Kraków, Poland, will be preceded by several special training courses.

The Courses are scheduled on Wednesday, July 2, 2008.
The tuition is € 100 (380 PLN) for one or more courses. Two courses will be presented in paralel, in the morning (A and B) and afternoon (C and D).

(A) Basic Thermography (4 hours)

by Prof. X. Maldague, Université Laval, Canada
by Prof. V. Vavilov, Tomsk Polytechnic University, Russia

(B) Applications of Thermography to Thermo-Fluid-Dynamics (3 hours)

by Prof. G. M. Carlomagno, Universita di Napoli Federico II, Italy

(C) Application of thermography to buildings (3 hours)

by Prof. E. Grinzato, CNR-ITC, Padova, Italy

(D) Medical Thermography (1 day)

by Prof. E. F. J. Ring, Dr P. Plassmann, Prof. K. Ammer, Dr R. Thomas; Medical Imaging Research Group, Faculty of Advanced Technology, University of Glamorgan, UK

(E) Application of dynamic thermography to Nondestructive Testing (3 hours)

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Infraspection Institute Releases New Standards for Infrared Thermography

Burlington, NJ, USA — February 13, 2008 — Infraspection Institute has announced the release of eight new standards for infrared thermography. Four of the new standards cover thermal imaging applications and four are dedicated to equipment operation and temperature measurement.



Jim Seffrin, Director of Infraspection Institute, states, “We are very excited about the release of our new standards. One of the most common requests among thermographers is to have a uniform set of industry standards. In fact, standards were high on the wish list of several attendees at our recent IR/INFO conference.”

Recognizing the need for standardized procedures, Infraspection Institute began publishing guidelines for thermography in 1993.

Since their initial publication, Infraspection Institute guidelines have been adopted by hundreds of companies worldwide and incorporated into documents published by recognized standards organizations such as the American Society for Testing and Materials (ASTM).

Beginning in 2007, Infraspection Institute guidelines were updated and renamed as standards to reflect their industry-wide acceptance and the best practices they embody.

Eight comprehensive standards are now available from Infraspection Institute. These documents cover equipment operation, temperature measurement, and specific thermographic applications. Current titles include:

Standard for Infrared Inspection of Electrical Systems & Rotating Equipment

Standard for Infrared Inspection of Insulated Roofs

Standard for Infrared Inspection of Building Envelopes

Standard for Infrared Inspections to Detect Pests and Pest Related Damage

Standard for Measuring and Compensating for Emittance Using Infrared Imaging Radiometers

Standard for Measuring and Compensating for Reflected Temperature Using Infrared Imaging Radiometers

Standard for Measuring and Compensating for Transmittance of an Attenuating Medium Using Infrared Imaging Radiometers

Standard for Measuring Distance/Target Size Values for Infrared Imaging Radiometers

Lake Louise, Alberta, CANADA — The Oral Program for the May 2007 -TEMPMEKO Conference & Exhibit at The Fairmont Chateau Lake Louise, Lake Louise, Alberta has been published on the Conference website: www.tempmeko2007.org

TEMPMEKO 2007 was the 10th International Symposium on Temperature and Thermal Measurements in Industry and Science, held 21-25 May 2007

THE PROGRAM INCLUDED SEVERAL SESSIONS ON RADIATION THERMOMETRY.

Poster Session 1 held Tuesday afternoon during the hours of 16:00-17:30, covered Radiation Thermometry and other subjects. Here’s the listing of the Posters of Interest.

TEMPMEKO 2007 Poster Session 1 Posters on Radiation Thermometry

32. INFRARED RADIATION THERMOMETER FOR CALIBRATION OF BLACKBODIES FOR CLINICAL THERMOMETERS, J Ishii

33. LINEARITY STUDY ON SPECTRAL EMISSIVITY MEASUREMENT FACILITY, Z Yuan, J Zhang, J Zhao, Y Liang, Y Duan

34. ANALYSIS OF THE ACCURACY OF THE METHODS FOR THE DIRECT EMISSIVITY MEASUREMENT, R B Pérez-Sáez, L del Campo, M J Tello

5. REFLECTANCE THERMOMETRY FOR MICRO-SCALE METAL SURFACE, Y Shimizu, J Ishii

6. A GRAPHICAL METHOD FOR CALCULATING REFLECTION ERRORS IN RADIATION THERMOMETRY, D R White, P Saunders