From the category archives:

Emissivity

IR/INFO 2010 At Disney World

Emissivity

Great New Venue – Jan. 10 – 13, 2010 !!

Burlington NJ & Orlando FL, USA — Warm weather, sunny skies, and the world’s premier gathering for thermographers and NDT professionals. Of course we’re talking about IR/INFO, the one IR event you can’t afford to miss!

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Thermal Infrared Radiation Thermometry in MBE

Emissivity

Ircon’s Application note AN110 of the same title as this story
Santa Cruz CA, USA — The use of Thermal Infrared Radiation Thermometry (Infrared or IR Thermometry) for substrate temperature measurement during molecular beam epitaxy (MBE), a semiconductor manufacturing process, is discussed in this free applications note on the Ircon website.
The fundamental relationships of radiation [...]

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RADIOMETRIC TEMPERATURE MEASUREMENTS: Volume II

Calibration

Aimed at Industrial practitioners of radiation thermometry; Scientific researchers using thermometers; Designers of thermometers
Applications
Edited by:
Zhuomin Zhang, George W. Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta, Georgia, USA
Benjamin Tsai, Optical Technology Division, National Institute of Standards and Technology, Gaithersburg, Maryland, USA
Graham Machin, Division of Industry and Innovation, National Physical Laboratory, Teddington, Middlesex, UK
Included [...]

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Rad-Pro (Radiative Properties)

Emissivity

From a webpage of Dr.Zhuomin Zhang at the Georgia Institute of Technology, Atlanta GA, USA:
Nanoscale Thermal Radiation Laboratory
In order to achieve high-accuracy temperature measurements in rapid thermal processing (RTP) using lightpipe radiation thermometry, it is critical to be able to determine the radiative properties of silicon wafers with thin-film coatings such as silicon dioxide, silicon [...]

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RADIOMETRIC TEMPERATURE MEASUREMENTS: Volume I

Calibration

Aimed at Industrial practitioners of radiation thermometry; Scientific researchers using thermometers; Designers of thermometers
Fundamentals
Edited By: Zhuomin Zhang, George W. Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta, Georgia, USA
Benjamin Tsai, Optical Technology Division, National Institute of Standards and Technology, Gaithersburg, Maryland, USA
Graham Machin, Division of Industry and Innovation, National Physical Laboratory, Teddington, Middlesex, [...]

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IR Thermography: Errors and Uncertainties

Calibration

A new book from John Wiley & Sons
In Infrared Thermography, the authors discuss the sources of uncertainty, including how to quantify these sources, associated with the use of thermal imagers.
This book explains the common misunderstandings in the interpretation of temperature measurements, and provides a metrological evaluation of commercially available infrared cameras.
It suggests how to [...]

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Beginners Cautions in Using IR Cameras

Emissivity

OR… What You Really Need to Know to Begin Using Infrared Cameras by L. Terry Clausing, Drysdale & Associates, Inc., Cincinnati OH, USA.
Columbus OH, USA — This 2006 online article at the American Society for Nondestructive Testing (ASNT) website speaks to some of the care needed with IR, or Infrared, Cameras, being used [...]

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IR FAQs

Emissivity

Ircon provides some unique answers online
Ircon Corp, a well-known industrial Infrared thermometer maker and educator of users, has a unique list of Frequently Asked Questions (FAQs) on its website.
They go a  long way to answering practical applications queries of both newcomers and some experienced users of Infrared Temperature Measurement devices.
The list of questions is extensive [...]

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CFP: 10th International QIRT

Calibration

10th International Conference on Quantitative Infrared Thermography – Quebec City, Canada, July 27-30, 2010

Quebec City, Quebec, CANADA — The Quantitative Infrared Thermography (QIRT) conference is an international forum which brings together specialists from industry and academia, who share an active interest in the latest developments of science, experimental practices and instrumentation, related [...]

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