Emissivity
Ircon’s Application note AN110 of the same title as this story
Santa Cruz CA, USA — The use of Thermal Infrared Radiation Thermometry (Infrared or IR Thermometry) for substrate temperature measurement during molecular beam epitaxy (MBE), a semiconductor manufacturing process, is discussed in this free applications note on the Ircon website.
The fundamental relationships of radiation [...]
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Calibration
Aimed at Industrial practitioners of radiation thermometry; Scientific researchers using thermometers; Designers of thermometers
Applications
Edited by:
Zhuomin Zhang, George W. Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta, Georgia, USA
Benjamin Tsai, Optical Technology Division, National Institute of Standards and Technology, Gaithersburg, Maryland, USA
Graham Machin, Division of Industry and Innovation, National Physical Laboratory, Teddington, Middlesex, UK
Included [...]
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